Automatic Test Equipment Design

Automatic test equipment ate is a huge umbrella like term sheltering device test board test both unloaded and loaded and system test.

Automatic test equipment design.

Caci has broken new ground in designing and developing test systems from cots components. Automatic test equipment on a budget nov 19 2001 abstract. The complexity of electronic device testing varies widely ranging from the simplest type manual testing to the most complex large scale automatic test equipment ate. These types of test systems are usually dedicated to testing a specific component.

These automatic test equipment systems are generally used for testing digital boards but these days these large testers are not widely used. In between simple manual testing and large scale ate lies the low budget and medium scale testing that is the focus of this application note. Our engineering staff develops software in traditional test languages such as assembly ansi c fortran and visual basic as well as automatic test equipment ate programming languages such as atlas abbreviated test language for all systems labview labwindows cvi and teststand. The hardware and software architecture of the design are described in detail.

A modular design for portable automatic test equipment used for on platform diagnostics is described. Automatic test equipment ate refers to any equipment used to perform assembly line type testing of produced items. Automatic test equipment or automated test equipment is any apparatus that performs tests on a device known as the device under test equipment under test or unit under test using automation to quickly perform measurements and evaluate the test results. An ate can be a simple computer controlled digital multimeter or a complicated system containing dozens of complex test instruments capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer t.

Generally the term is applied to equipment that is used in testing integrated circuits and printed circuit boards during the manufacturing process. Rising silicon transition speeds and higher data rates.